Magnetoresistance and compositional modulation near the layer boundary of Co/Cu multilayers produced by pulse electrodeposition

Y. Ueda, N. Kikuchi, S. Ikeda, T. Houga

Research output: Contribution to journalConference articlepeer-review

27 Citations (Scopus)

Abstract

The effect of the compositional modulation and the structure near the layer boundary between ferromagnetic and nonmagnetic metals, on magnetoresistance (MR) in the Co/Cu multilayers produced by pulse electrodeposition method has been investigated. It was possible to control the film thickness in the atomic scale (2-3 angstroms) by electrodeposition. From the experiments on the films with composition modulation near the layer boundary between ferromagnetic Co-rich layer and nonmagnetic Cu layer, it is observed that the MR ratio depends strongly on the thickness of the ferromagnetic layer rather than the change of the composition near the interface between magnetic and nonmagnetic layers.

Original languageEnglish
Pages (from-to)740-742
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Volume198
DOIs
Publication statusPublished - 1999 Jun 1
Externally publishedYes
EventProceedings of the 1998 3rd International Symposium on Metallic Multilayers (MML-98) - Vancouver, BC, Can
Duration: 1998 Jun 141998 Jun 19

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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