The out-of-plane magnetocrystalline anisotropy and magnetoelastic properties of series of epitaxially grown layers of Co2Fe0.4Mn0.6Si (CFMS) and Co2FeGa0.5Ge0.5 (CFGG) Heusler alloys thin films deposited on MgO with chromium buffer layer were investigated by means of the ferromagnetic resonance (FMR), SQUID magnetometer, and by the strain modulated FMR technique. The magnitude of the magnetocrystalline anisotropy constant was found to decrease with increasing layer thickness. The change of the anisotropy is caused mainly by the surface effects. However, for some of the samples series, the change of chemical ordering with the change of the magnetic layer thickness was also observed. An additional silver buffer layer influence on the properties of the magnetic layer was also investigated. For all three of the investigated series of the Heusler alloys, i.e., CFMS without Ag, CFMS with Ag, and CFGG, the experimentally observed magnitude of the magnetoelastic constant increases with the increase of the magnetic layer thickness.
- Heusler alloys
- magnetic anisotropy
- magnetoelastic properties
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering