Magnetization reversal of deep submicron magnetic elements

N. Tezuka; E. Kitagawa; K. Inomata; S. Sugimoto

doi:10.1109/INTMAG.2002.1001209

Magnetization reversal of deep submicron magnetic elements

N. Tezuka, E. Kitagawa, K. Inomata, S. Sugimoto

ENG - Materials Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Magnetic films patterned into deep submicron scale are of great interest with future high density storage and memory devices. These applications require the magnetic behavior, especially switching field, of submicron elements to be well defined. We have calculated the switching field behavior and remanent magnetization configuration for single films and synthetic antiferromagnets (ferromagnet/nonmagnet/ferromagnet:SyAF). In this work, experimental study was carried out using Ni₈₀Fe₂₀ films. We will present these results in conjunction with the results of the micromagnetic simulation and demonstrate the advantage of the SyAF.

Original language	English
Title of host publication	INTERMAG Europe 2002 - IEEE International Magnetics Conference
Editors	J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	0780373650, 9780780373655
DOIs	https://doi.org/10.1109/INTMAG.2002.1001209
Publication status	Published - 2002 Jan 1
Event	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands Duration: 2002 Apr 28 → 2002 May 2

Publication series

Name	INTERMAG Europe 2002 - IEEE International Magnetics Conference

Other

Other	2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
Country/Territory	Netherlands
City	Amsterdam
Period	02/4/28 → 02/5/2

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering
Surfaces, Coatings and Films

Access to Document

10.1109/INTMAG.2002.1001209

Cite this

Tezuka, N., Kitagawa, E., Inomata, K., & Sugimoto, S. (2002). Magnetization reversal of deep submicron magnetic elements. In J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, J. De Boeck, & R. Wood (Eds.), INTERMAG Europe 2002 - IEEE International Magnetics Conference [1001209] (INTERMAG Europe 2002 - IEEE International Magnetics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2002.1001209

Magnetization reversal of deep submicron magnetic elements. / Tezuka, N.; Kitagawa, E.; Inomata, K.; Sugimoto, S.

INTERMAG Europe 2002 - IEEE International Magnetics Conference. ed. / J. Fidler; B. Hillebrands; C. Ross; D. Weller; L. Folks; E. Hill; M. Vazquez Villalabeitia; J. A. Bain; Jo De Boeck; R. Wood. Institute of Electrical and Electronics Engineers Inc., 2002. 1001209 (INTERMAG Europe 2002 - IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Tezuka, N, Kitagawa, E, Inomata, K & Sugimoto, S 2002, Magnetization reversal of deep submicron magnetic elements. in J Fidler, B Hillebrands, C Ross, D Weller, L Folks, E Hill, M Vazquez Villalabeitia, JA Bain, J De Boeck & R Wood (eds), INTERMAG Europe 2002 - IEEE International Magnetics Conference., 1001209, INTERMAG Europe 2002 - IEEE International Magnetics Conference, Institute of Electrical and Electronics Engineers Inc., 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002, Amsterdam, Netherlands, 02/4/28. https://doi.org/10.1109/INTMAG.2002.1001209

Tezuka N, Kitagawa E, Inomata K, Sugimoto S. Magnetization reversal of deep submicron magnetic elements. In Fidler J, Hillebrands B, Ross C, Weller D, Folks L, Hill E, Vazquez Villalabeitia M, Bain JA, De Boeck J, Wood R, editors, INTERMAG Europe 2002 - IEEE International Magnetics Conference. Institute of Electrical and Electronics Engineers Inc. 2002. 1001209. (INTERMAG Europe 2002 - IEEE International Magnetics Conference). https://doi.org/10.1109/INTMAG.2002.1001209

Tezuka, N. ; Kitagawa, E. ; Inomata, K. ; Sugimoto, S. / Magnetization reversal of deep submicron magnetic elements. INTERMAG Europe 2002 - IEEE International Magnetics Conference. editor / J. Fidler ; B. Hillebrands ; C. Ross ; D. Weller ; L. Folks ; E. Hill ; M. Vazquez Villalabeitia ; J. A. Bain ; Jo De Boeck ; R. Wood. Institute of Electrical and Electronics Engineers Inc., 2002. (INTERMAG Europe 2002 - IEEE International Magnetics Conference).

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AB - Magnetic films patterned into deep submicron scale are of great interest with future high density storage and memory devices. These applications require the magnetic behavior, especially switching field, of submicron elements to be well defined. We have calculated the switching field behavior and remanent magnetization configuration for single films and synthetic antiferromagnets (ferromagnet/nonmagnet/ferromagnet:SyAF). In this work, experimental study was carried out using Ni80Fe20 films. We will present these results in conjunction with the results of the micromagnetic simulation and demonstrate the advantage of the SyAF.

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Magnetization reversal of deep submicron magnetic elements

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