We present an X-ray magnetic circular dichroism (XMCD) study on a nanoscale nonlocal spin injection structure consisting of a perpendicular polarizer and an in-plane free layer. We perform XMCD measurements while applying an operating current to the sample, and observe that the free layer magnetization tilts to the perpendicular direction owing to injection of perpendicular spin. A photoelectron collection method utilizing an order-sorting-aperture (OSA) is developed for this measurement. This OSA collection method enables XMCD measurement on a sample under current application, and its measurement quality is comparable to that recorded with the conventional total electron yield method.
ASJC Scopus subject areas
- Physics and Astronomy(all)