MAGNETIC SECTOR ATOM-PROBE FIELD ION MICROSCOPE WITH A RETARDING POTENTIAL ANALYZER.

Robert J. Culbertson, Toshio Sakurai

    Research output: Contribution to journalArticlepeer-review

    4 Citations (Scopus)

    Abstract

    A combination of a magnetic sector atom-probe field ion microscope and a filter-lens-type retarding potential analyzer makes possible the investigation of the energy distribution of field desorption as well as field ionization and the field ion energy deficit with respect to the emitter potential on an absolute energy scale. The performance of this analyzer was evaluated using various imaging gases, and its resolution is estimated to be better than 100 meV out of a 2000 eV primary energy.

    Original languageEnglish
    Pages (from-to)1752-1755
    Number of pages4
    JournalJournal of vacuum science & technology
    Volume15
    Issue number5
    DOIs
    Publication statusPublished - 1978 Sep

    ASJC Scopus subject areas

    • Engineering(all)

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