Magnetic properties of ultrathin cobalt films on SiO2 substrates

Shiro Entani, Manabu Kiguchi, Susumu Ikeda, Koichiro Saiki

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)


Thickness dependent magnetism of the ultrathin Co films grown on SiO 2 substrates was studied by surface magneto-optical Kerr effect in ultrahigh vacuum. The complicated thickness dependence of magnetization, coercive force and magnetic susceptibility was discussed in relation to surface morphology. Existence of 1 monolayer (ML) dead layer originated from partial oxidation at the Co/SiO2 interface. For the thinner films (∼2 ML), resistance to the magnetic reversal process was large because of larger surface roughness. For thicker films, reduction of the resistance was observed because of formation of continuous and defect less films.

Original languageEnglish
Pages (from-to)221-225
Number of pages5
JournalThin Solid Films
Issue number1-2
Publication statusPublished - 2005 Dec 22
Externally publishedYes


  • Cobalt
  • Magnetic properties and measurements
  • Surface morphology

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry


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