Magnetic properties of FeRh alloy films prepared by ion-beam sputtering were investigated. The purpose of the study was to reduce post annealing temperature to obtain the ordered structure and a relatively sharp magnetic transition on glass or silicon wafer substrates. The film composition was determined by energy dispersion X-ray analysis. The temperature dependence of magnetization was measured by vibrating sample magnetometers.
|Journal||Digests of the Intermag Conference|
|Publication status||Published - 2002 Dec 1|
|Event||2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands|
Duration: 2002 Apr 28 → 2002 May 2
ASJC Scopus subject areas
- Electrical and Electronic Engineering