The multilayer thin films having the form of Ti(30 nm/Fe(dFe)/[Nd-Fe-B(dNd-Fe-B)/Fe(dFe)] X5/Ti(30 nm)/glass were fabricated on glass substrates by means of radio frequency (rf) sputtering, with dFe varied from 0 to 50 nm and dNd-Fe-B from 0 to 100 nm. Magnetization measurements have revealed that the minor loops of the films are reversible in a certain range of demagnetization fields except for the films with dFe∼0 nm or dNd-Fe-B<10 nm Micromagnetic calculation of magnetization curves has been performed, which has well reproduced the observed hysteresis loops including spring-back behavior and the dependence of the coercive field HcJ on dFe and dNd-Fe-B. From the comparison between experiment and calculation, we can infer that the interlayer exchange-coupling strength is about 10% of the intralayer couplings, which are found to be almost independent of dFe and dNd-Fe-B.
|Number of pages||3|
|Journal||Journal of Applied Physics|
|Issue number||8 PART 2A|
|Publication status||Published - 1997 Apr 15|
ASJC Scopus subject areas
- Physics and Astronomy(all)