Magnetic properties of epitaxial Co 2Cr 1-xFe xAl full Heusler alloy thin films with the L2 1 structure

Astufumi Hirohata, Hidekazu Kurebayashi, Susumu Okamura, Nobuki Tezuka, Koichiro Inomata

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

Co 2Cr 1-xFe xAl full Heusler alloy thin films (x ≥ 0.4) have been epitaxially grown on GaAs(001) substrates under the optimized condition. Structural analysis reveals the detailed growth mechanism of the films and confirms that the films form the perfectly ordered L2 1 structure. A magnetization measurement also shows the films possess very strong uniaxial crystalline anisotropy due to the epitaxial growth. By using these films as bottom electrodes of magnetic tunnel junctions, the maximum tunnel magnetoresistance ratio of 8.8% is observed after post-annealing with Al-O insulating barriers for x = 1.

Original languageEnglish
Pages (from-to)2802-2804
Number of pages3
JournalIEEE Transactions on Magnetics
Volume41
Issue number10
DOIs
Publication statusPublished - 2005 Oct

Keywords

  • Epitaxial growth
  • Full Heusler alloys
  • Half-metallic ferromagnets
  • Tunnel magnetoresistance

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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