Magnetic near field probe based on the high-frequency carrier type thin-film magnetic field sensor

Masahiro Yamaguchi, Hiroaki Kikuchi, Satoshi Sugimoto, Ken Ichi Arai, Mizuki Iwanami, Atsushi Nakamura, Shigeki Hoshino

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Rapid growth of information technology (IT) markets has raised a need of magnetic near field measurements on densely packaged PCBs and LSIs for the detection of the source current of electromagnetic emission and the evaluation of electronic signal integrity. This paper proposes a new application of the high frequency carrier type magnetic field sensor (or so-called GMI sensor) to a miniature magnetic near field probe with high sensitivity in just a 100 μm size.

Original languageEnglish
Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
EditorsJ. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780373650, 9780780373655
DOIs
Publication statusPublished - 2002 Jan 1
Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

Publication series

NameINTERMAG Europe 2002 - IEEE International Magnetics Conference

Other

Other2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
CountryNetherlands
CityAmsterdam
Period02/4/2802/5/2

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films

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