Magnetic near field probe based on the high-frequency carrier type thin-film magnetic field sensor

Masahiro Yamaguchi, Hiroaki Kikuchi, Satoshi Sugimoto, Ken Ichi Arai, Mizuki Iwanami, Atsushi Nakamura, Shigeki Hoshino

Research output: Contribution to journalConference articlepeer-review

Abstract

The magnetic near field probe based on the high-frequency carrier type thin-film magnetic field sensors was described. The sensor was connected to a thin-film parallel transmission line to make a solder ball connection to the mother PCB board that scans over a test PCB. The results showed that the probe could distinguish a dc current-carrying meander line of a line pitch of 200μm.

Original languageEnglish
Pages (from-to)DQ14
JournalDigests of the Intermag Conference
Publication statusPublished - 2002 Dec 1
Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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