Magnetic field observations in CoFeB/Ta layers with 0.67-nm resolution by electron holography

Toshiaki Tanigaki, Tetsuya Akashi, Akira Sugawara, Katsuya Miura, Jun Hayakawa, Kodai Niitsu, Takeshi Sato, Xiuzhen Yu, Yasuhide Tomioka, Ken Harada, Daisuke Shindo, Yoshinori Tokura, Hiroyuki Shinada

    Research output: Contribution to journalArticlepeer-review

    16 Citations (Scopus)

    Abstract

    Nanometre-scale magnetic field distributions in materials such as those at oxide interfaces, in thin layers of spintronics devices, and at boundaries in magnets have become important research targets in materials science and applied physics. Electron holography has advantages in nanometric magnetic field observations, and the realization of aberration correctors has improved its spatial resolution. Here we show the subnanometre magnetic field observations inside a sample at 0.67-nm resolution achieved by an aberration-corrected 1.2-MV holography electron microscope with a pulse magnetization system. A magnetization reduction due to intermixing in a CoFeB/Ta multilayer is analyzed by observing magnetic field and electrostatic potential distributions simultaneously. Our results demonstrate that high-voltage electron holography can be widely applied to pin-point magnetization analysis with structural and composition information in physics, chemistry, and materials science.

    Original languageEnglish
    Article number16598
    JournalScientific reports
    Volume7
    Issue number1
    DOIs
    Publication statusPublished - 2017 Dec 1

    ASJC Scopus subject areas

    • General

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