Magnetic distribution of the free layer on patterned MTJ multilayers

Cheol Gi Kim; Chong Oh Kim; Tae Sik Yoon; Masakiyo Tsunoda; Migaku Takahashi

doi:10.1016/S0304-8853(03)00489-X

Magnetic distribution of the free layer on patterned MTJ multilayers

Cheol Gi Kim, Chong Oh Kim, Tae Sik Yoon, Masakiyo Tsunoda, Migaku Takahashi

ENG - Electronic Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Local M-H loops have been measured on the free layer of a magnetic tunnel junction multilayers using the magneto-optical Kerr effect system, with 2 μm spatial resolution. The relatively irregular variations of coercivity H _C (∼17.5 Oe) and exchange coupling field H_E (∼7.5 Oe) are revealed in as-deposited sample prepared by the DC magnetron sputtering. After 200°C annealing, H_C decreases to 15 Oe, while H _E increases to 20 Oe with smooth local variation. Two-dimensional plots of H_C and H_E show the symmetric saddle shapes with their axes aligned with the pinned layer, where both H_C and H _E variations along free-layer axis are larger than those along pinned-layer axis. The increasing slope per micrometer of normalized H _C and H_E are the same near the junction edge along free-layer direction irrespective of junction size, giving the relatively uniform H_C and H_E for wider junction size.

Original language	English
Pages (from-to)	271-276
Number of pages	6
Journal	Journal of Magnetism and Magnetic Materials
Volume	268
Issue number	1-2
DOIs	https://doi.org/10.1016/S0304-8853(03)00489-X
Publication status	Published - 2004 Jan 1

Keywords

Coercivity
Exchange coupling
MTJ
Size effect

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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title = "Magnetic distribution of the free layer on patterned MTJ multilayers",

abstract = "Local M-H loops have been measured on the free layer of a magnetic tunnel junction multilayers using the magneto-optical Kerr effect system, with 2 μm spatial resolution. The relatively irregular variations of coercivity H C (∼17.5 Oe) and exchange coupling field HE (∼7.5 Oe) are revealed in as-deposited sample prepared by the DC magnetron sputtering. After 200°C annealing, HC decreases to 15 Oe, while H E increases to 20 Oe with smooth local variation. Two-dimensional plots of HC and HE show the symmetric saddle shapes with their axes aligned with the pinned layer, where both HC and H E variations along free-layer axis are larger than those along pinned-layer axis. The increasing slope per micrometer of normalized H C and HE are the same near the junction edge along free-layer direction irrespective of junction size, giving the relatively uniform HC and HE for wider junction size.",

keywords = "Coercivity, Exchange coupling, MTJ, Size effect",

author = "Kim, {Cheol Gi} and Kim, {Chong Oh} and Yoon, {Tae Sik} and Masakiyo Tsunoda and Migaku Takahashi",

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TY - JOUR

T1 - Magnetic distribution of the free layer on patterned MTJ multilayers

AU - Kim, Cheol Gi

AU - Kim, Chong Oh

AU - Yoon, Tae Sik

AU - Tsunoda, Masakiyo

AU - Takahashi, Migaku

PY - 2004/1/1

Y1 - 2004/1/1

N2 - Local M-H loops have been measured on the free layer of a magnetic tunnel junction multilayers using the magneto-optical Kerr effect system, with 2 μm spatial resolution. The relatively irregular variations of coercivity H C (∼17.5 Oe) and exchange coupling field HE (∼7.5 Oe) are revealed in as-deposited sample prepared by the DC magnetron sputtering. After 200°C annealing, HC decreases to 15 Oe, while H E increases to 20 Oe with smooth local variation. Two-dimensional plots of HC and HE show the symmetric saddle shapes with their axes aligned with the pinned layer, where both HC and H E variations along free-layer axis are larger than those along pinned-layer axis. The increasing slope per micrometer of normalized H C and HE are the same near the junction edge along free-layer direction irrespective of junction size, giving the relatively uniform HC and HE for wider junction size.

AB - Local M-H loops have been measured on the free layer of a magnetic tunnel junction multilayers using the magneto-optical Kerr effect system, with 2 μm spatial resolution. The relatively irregular variations of coercivity H C (∼17.5 Oe) and exchange coupling field HE (∼7.5 Oe) are revealed in as-deposited sample prepared by the DC magnetron sputtering. After 200°C annealing, HC decreases to 15 Oe, while H E increases to 20 Oe with smooth local variation. Two-dimensional plots of HC and HE show the symmetric saddle shapes with their axes aligned with the pinned layer, where both HC and H E variations along free-layer axis are larger than those along pinned-layer axis. The increasing slope per micrometer of normalized H C and HE are the same near the junction edge along free-layer direction irrespective of junction size, giving the relatively uniform HC and HE for wider junction size.

KW - Coercivity

KW - Exchange coupling

KW - MTJ

KW - Size effect

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