Co2FeSi films were prepared using magnetron sputtering technique on Cr buffer layers and MgO(001) substrates at various annealing temperatures. We investigated the crystal structures, magnetic properties (Ms and Hc), surface roughness, and magnetic damping constants (α) of the prepared Co2 FeSi films. Out-of-plane angular dependences of the resonance field and the linewidth of the ferromagnetic resonance spectra were measured and fitted using the Landau-Lifshitz-Gilbert equation to determine the damping constant. The as-deposited Co2 FeSi film exhibited an amorphous and disordered structure; the α value was 0.008. In contrast, the Co2 FeSi films annealed over 300 °C showed epitaxial growth and had a (001)-oriented and L 21 ordered structure. Both disordered and L 21 ordered Co2 FeSi films showed similar α values.
ASJC Scopus subject areas
- Physics and Astronomy(all)