Mössbauer spectroscopy, Rutherford backscattering spectrometry and X-ray diffraction studies of the interface structure of iron/metal multilayer films

M. Murayama, S. Nagata, K. Takahiro, R. Hanada, S. Yamaguchi

Research output: Contribution to journalArticle

Abstract

Fe/M (M = Ag, Sn) multilayer films have been prepared by a vacuum evaporation method. RBS is performed to examine the depth profile of the multilayer films. For M = Ag, a layer structure with a well defined interface is formed by the present evaporation method. Mössbauer spectroscopy as well as XRD shows that the Fe in the multilayer is in an α-Fe state. For M = Sn, RBS showed that a considerable mixing had taken place between Fe and Sn during the multilayer procedure.

Original languageEnglish
Pages (from-to)113-116
Number of pages4
JournalJournal of Magnetism and Magnetic Materials
Volume126
Issue number1-3
DOIs
Publication statusPublished - 1993 Sep

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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