Low temperature acoustic microscopy for material characterization

Kazushi Yamanaka, Yoshihiko Nagata, Toshio Koda, Koichi Karaki

Research output: Contribution to journalConference articlepeer-review

8 Citations (Scopus)

Abstract

To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30°C and -94°C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30°C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.

Original languageEnglish
Pages (from-to)913-920
Number of pages8
JournalUltrasonics Symposium Proceedings
Volume2
Publication statusPublished - 1990 Dec 1
EventProceedings of the IEEE 1990 Ultrasonics Symposium - Honolulu, HI, USA
Duration: 1990 Dec 41990 Dec 7

ASJC Scopus subject areas

  • Engineering(all)

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