Low temperature acoustic microscopy for material characterization

Kazushi Yamanaka; Yoshihiko Nagata; Toshio Koda; Koichi Karaki

Low temperature acoustic microscopy for material characterization

Kazushi Yamanaka, Yoshihiko Nagata, Toshio Koda, Koichi Karaki

New Industry Creation Hatchery Center (NICHe)

Research output: Contribution to journal › Conference article › peer-review

8 Citations (Scopus)

Abstract

To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30°C and -94°C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30°C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.

Original language	English
Pages (from-to)	913-920
Number of pages	8
Journal	Ultrasonics Symposium Proceedings
Volume	2
Publication status	Published - 1990 Dec 1
Event	Proceedings of the IEEE 1990 Ultrasonics Symposium - Honolulu, HI, USA Duration: 1990 Dec 4 → 1990 Dec 7

ASJC Scopus subject areas

Engineering(all)

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title = "Low temperature acoustic microscopy for material characterization",

abstract = "To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30°C and -94°C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30°C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.",

author = "Kazushi Yamanaka and Yoshihiko Nagata and Toshio Koda and Koichi Karaki",

year = "1990",

month = dec,

day = "1",

language = "English",

volume = "2",

pages = "913--920",

journal = "Ultrasonics Symposium Proceedings",

issn = "0090-5607",

note = "Proceedings of the IEEE 1990 Ultrasonics Symposium ; Conference date: 04-12-1990 Through 07-12-1990",

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TY - JOUR

T1 - Low temperature acoustic microscopy for material characterization

AU - Yamanaka, Kazushi

AU - Nagata, Yoshihiko

AU - Koda, Toshio

AU - Karaki, Koichi

PY - 1990/12/1

Y1 - 1990/12/1

N2 - To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30°C and -94°C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30°C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.

AB - To characterize the mechanical properties of materials at low temperatures, a novel variable low-temperature scanning acoustic microscopy (VLTSAM) has been developed. The temperature of the sample can be continuously varied between 30°C and -94°C in a methanol coupler. As a demonstration of the VLTSAM, frozen onion cells were imaged at quenched and slowly cooled states. Defects in a 0.6-mm-thick epoxy layer were also observed at -30°C with much more sensitivity than at ambient temperatures. As a tool to analyze subsurface images in VLTSAM, the V(z) curve theory for SAM was extended to describe time-resolved subsurface echoes.

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M3 - Conference article

AN - SCOPUS:0025577304

VL - 2

SP - 913

EP - 920

JO - Ultrasonics Symposium Proceedings

JF - Ultrasonics Symposium Proceedings

SN - 0090-5607

T2 - Proceedings of the IEEE 1990 Ultrasonics Symposium

Y2 - 4 December 1990 through 7 December 1990

ER -