Abstract
An X-ray diffractometer (XRD) was modified to a low-power total reflection X-ray fluorescence (TXRF) spectrometer. This was realized by reducing the XRD tube power (3 kW) down to 10 W by a Spellman power supply. The present spectrometer consisted of a waveguide slit, Si-PIN detector, a goniometer and two Z-axis stages that were set on a diffractometer guide rail. This unit was easy in assembly. The first measurements with this spectrometer were presented. The minimum detection limit for Cr was estimated to be a few nanograms or at the level of 1013 atoms cm-2.
Original language | English |
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Pages (from-to) | 36-39 |
Number of pages | 4 |
Journal | Powder Diffraction |
Volume | 30 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2015 Oct 21 |
Externally published | Yes |
Keywords
- diffractometer guide rail
- high-power XRD tube
- low-power TXRF
- power supply
ASJC Scopus subject areas
- Radiation
- Materials Science(all)
- Instrumentation
- Condensed Matter Physics