Low-power total reflection X-ray fluorescence spectrometer using diffractometer guide rail

Ying Liu; Susumu Imashuku; Jun Kawai

doi:10.1017/S0885715614000797

Low-power total reflection X-ray fluorescence spectrometer using diffractometer guide rail

Ying Liu, Susumu Imashuku, Jun Kawai

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

An X-ray diffractometer (XRD) was modified to a low-power total reflection X-ray fluorescence (TXRF) spectrometer. This was realized by reducing the XRD tube power (3 kW) down to 10 W by a Spellman power supply. The present spectrometer consisted of a waveguide slit, Si-PIN detector, a goniometer and two Z-axis stages that were set on a diffractometer guide rail. This unit was easy in assembly. The first measurements with this spectrometer were presented. The minimum detection limit for Cr was estimated to be a few nanograms or at the level of 10¹³ atoms cm^-2.

Original language	English
Pages (from-to)	36-39
Number of pages	4
Journal	Powder Diffraction
Volume	30
Issue number	1
DOIs	https://doi.org/10.1017/S0885715614000797
Publication status	Published - 2015 Oct 21
Externally published	Yes

Keywords

diffractometer guide rail
high-power XRD tube
low-power TXRF
power supply

ASJC Scopus subject areas

Radiation
Materials Science(all)
Instrumentation
Condensed Matter Physics

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10.1017/S0885715614000797

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@article{f96f5dd261fa4f9ab21be28bbb71bb50,

title = "Low-power total reflection X-ray fluorescence spectrometer using diffractometer guide rail",

abstract = "An X-ray diffractometer (XRD) was modified to a low-power total reflection X-ray fluorescence (TXRF) spectrometer. This was realized by reducing the XRD tube power (3 kW) down to 10 W by a Spellman power supply. The present spectrometer consisted of a waveguide slit, Si-PIN detector, a goniometer and two Z-axis stages that were set on a diffractometer guide rail. This unit was easy in assembly. The first measurements with this spectrometer were presented. The minimum detection limit for Cr was estimated to be a few nanograms or at the level of 1013 atoms cm-2.",

keywords = "diffractometer guide rail, high-power XRD tube, low-power TXRF, power supply",

author = "Ying Liu and Susumu Imashuku and Jun Kawai",

year = "2015",

month = oct,

day = "21",

doi = "10.1017/S0885715614000797",

language = "English",

volume = "30",

pages = "36--39",

journal = "Powder Diffraction",

issn = "0885-7156",

publisher = "International Centre For Diffraction Data",

number = "1",

}

TY - JOUR

T1 - Low-power total reflection X-ray fluorescence spectrometer using diffractometer guide rail

AU - Liu, Ying

AU - Imashuku, Susumu

AU - Kawai, Jun

PY - 2015/10/21

Y1 - 2015/10/21

N2 - An X-ray diffractometer (XRD) was modified to a low-power total reflection X-ray fluorescence (TXRF) spectrometer. This was realized by reducing the XRD tube power (3 kW) down to 10 W by a Spellman power supply. The present spectrometer consisted of a waveguide slit, Si-PIN detector, a goniometer and two Z-axis stages that were set on a diffractometer guide rail. This unit was easy in assembly. The first measurements with this spectrometer were presented. The minimum detection limit for Cr was estimated to be a few nanograms or at the level of 1013 atoms cm-2.

AB - An X-ray diffractometer (XRD) was modified to a low-power total reflection X-ray fluorescence (TXRF) spectrometer. This was realized by reducing the XRD tube power (3 kW) down to 10 W by a Spellman power supply. The present spectrometer consisted of a waveguide slit, Si-PIN detector, a goniometer and two Z-axis stages that were set on a diffractometer guide rail. This unit was easy in assembly. The first measurements with this spectrometer were presented. The minimum detection limit for Cr was estimated to be a few nanograms or at the level of 1013 atoms cm-2.

KW - diffractometer guide rail

KW - high-power XRD tube

KW - low-power TXRF

KW - power supply

UR - http://www.scopus.com/inward/record.url?scp=84925053412&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84925053412&partnerID=8YFLogxK

U2 - 10.1017/S0885715614000797

DO - 10.1017/S0885715614000797

M3 - Article

AN - SCOPUS:84925053412

VL - 30

SP - 36

EP - 39

JO - Powder Diffraction

JF - Powder Diffraction

SN - 0885-7156

IS - 1

ER -

Low-power total reflection X-ray fluorescence spectrometer using diffractometer guide rail

Abstract

Keywords

ASJC Scopus subject areas

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