Low energy electron diffraction and X-Ray photoelectron spectroscopy studies of the formation of submonolayer interfaces of Sb/Si(111)

Chong Yun Park, Tadashi Abukawa, Toyohiko Kinoshita, Yoshiharu Enta, Shozo Kono

Research output: Contribution to journalArticlepeer-review

92 Citations (Scopus)

Abstract

Surface reconstructions of a submonolayer Sb/Si(111) system were investigated by low-energy electron diffraction and X-ray photoelectron spectroscopy. It has been found that the surface superstructures of diffuse 2Ö2 (or three-domain 2Ö1), √3Ö√3, 5√3Ö5√3 and 7√3Ö7√3 are formed for the Sb coverages around one monolayer.

Original languageEnglish
Pages (from-to)147-148
Number of pages2
JournalJapanese journal of applied physics
Volume27
Issue number1R
DOIs
Publication statusPublished - 1988 Jan

Keywords

  • Interface
  • Low energy electron diffraction
  • Overlayer
  • Sb
  • Si(111)
  • Sntimony
  • Surface structure
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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