Low energy electron diffraction and X-Ray photoelectron spectroscopy studies of the formation of submonolayer interfaces of Sb/Si(111)

Chong Yun Park; Tadashi Abukawa; Toyohiko Kinoshita; Yoshiharu Enta; Shozo Kono

doi:10.1143/JJAP.27.147

Low energy electron diffraction and X-Ray photoelectron spectroscopy studies of the formation of submonolayer interfaces of Sb/Si(111)

Chong Yun Park, Tadashi Abukawa, Toyohiko Kinoshita, Yoshiharu Enta, Shozo Kono

Division of Inorganic Material Research

Research output: Contribution to journal › Article › peer-review

92 Citations (Scopus)

Abstract

Surface reconstructions of a submonolayer Sb/Si(111) system were investigated by low-energy electron diffraction and X-ray photoelectron spectroscopy. It has been found that the surface superstructures of diffuse 2Ö2 (or three-domain 2Ö1), √3Ö√3, 5√3Ö5√3 and 7√3Ö7√3 are formed for the Sb coverages around one monolayer.

Original language	English
Pages (from-to)	147-148
Number of pages	2
Journal	Japanese journal of applied physics
Volume	27
Issue number	1R
DOIs	https://doi.org/10.1143/JJAP.27.147
Publication status	Published - 1988 Jan

Keywords

Interface
Low energy electron diffraction
Overlayer
Sb
Si(111)
Sntimony
Surface structure
X-ray photoelectron spectroscopy

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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Low energy electron diffraction and X-Ray photoelectron spectroscopy studies of the formation of submonolayer interfaces of Sb/Si(111). / Park, Chong Yun; Abukawa, Tadashi; Kinoshita, Toyohiko; Enta, Yoshiharu; Kono, Shozo.

In: Japanese journal of applied physics, Vol. 27, No. 1R, 01.1988, p. 147-148.

Research output: Contribution to journal › Article › peer-review

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AU - Enta, Yoshiharu

AU - Kono, Shozo

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