Long term retention characteristic of small inverted dots formed on congruent single-crystal LiTaO3

Yasuo Cho, Nozomi Odagawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To investigate the long-term retention characteristics of a ferroelectric-data-storage system, 80-nm-thick congruent LiTaO3 plates with inverted-domain dot arrays composed of 100-nm- Φ dots were baked at 220, 250, 280 and 300°C. After heat treatment over a range of different time intervals, the dots shrank. From the change in the dot radius data, the activation energy (Ea) and frequency factor (a), parameters of the Arrhenius equation, were determined to be = 0.76 eV, = 2.21×105. From these parameter we can predict competitive retention characteristics compared with general memory devices. The phenomenon of dot shrinking can be explained from the energy transition of the system based on wall energy.

Original languageEnglish
Title of host publicationFerroelectrics and Multiferroics
PublisherMaterials Research Society
Pages90-95
Number of pages6
ISBN (Print)9781604234183
DOIs
Publication statusPublished - 2006 Jan 1
Event2006 MRS Fall Meeting - Boston, MA, United States
Duration: 2006 Nov 272006 Nov 29

Publication series

NameMaterials Research Society Symposium Proceedings
Volume966
ISSN (Print)0272-9172

Other

Other2006 MRS Fall Meeting
CountryUnited States
CityBoston, MA
Period06/11/2706/11/29

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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