Local transport property on ferromagnetic tunnel junction measured using conducting atomic force microscope

Yasuo Ando; Hiroshi Kameda; Hitoshi Kubota; Terunobu Miyazaki

Local transport property on ferromagnetic tunnel junction measured using conducting atomic force microscope

Yasuo Ando, Hiroshi Kameda, Hitoshi Kubota, Terunobu Miyazaki

ENG - Applied Physics

Research output: Contribution to journal › Article › peer-review

20 Citations (Scopus)

Abstract

The local topographical and electrical properties were measured simultaneously for a Ni₈₀Fe₂₀/Co/Al-oxide junction. Images with a lateral resolution of 1 nm and a current sensitivity of 3 pA were successfully obtained; no strong correlation between them was observed. From the results of local current-voltage characteristics also measured, it was clarified that the contrast of the current image indicated the distribution of barrier heights. The histogram of current density calculated by taking into consideration a Gaussian distribution corresponded qualitatively to the experimental result.

Original language	English
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	38
Issue number	7 A
Publication status	Published - 1999 Jan 1

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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abstract = "The local topographical and electrical properties were measured simultaneously for a Ni80Fe20/Co/Al-oxide junction. Images with a lateral resolution of 1 nm and a current sensitivity of 3 pA were successfully obtained; no strong correlation between them was observed. From the results of local current-voltage characteristics also measured, it was clarified that the contrast of the current image indicated the distribution of barrier heights. The histogram of current density calculated by taking into consideration a Gaussian distribution corresponded qualitatively to the experimental result.",

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AU - Ando, Yasuo

AU - Kameda, Hiroshi

AU - Kubota, Hitoshi

AU - Miyazaki, Terunobu

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Y1 - 1999/1/1

N2 - The local topographical and electrical properties were measured simultaneously for a Ni80Fe20/Co/Al-oxide junction. Images with a lateral resolution of 1 nm and a current sensitivity of 3 pA were successfully obtained; no strong correlation between them was observed. From the results of local current-voltage characteristics also measured, it was clarified that the contrast of the current image indicated the distribution of barrier heights. The histogram of current density calculated by taking into consideration a Gaussian distribution corresponded qualitatively to the experimental result.

AB - The local topographical and electrical properties were measured simultaneously for a Ni80Fe20/Co/Al-oxide junction. Images with a lateral resolution of 1 nm and a current sensitivity of 3 pA were successfully obtained; no strong correlation between them was observed. From the results of local current-voltage characteristics also measured, it was clarified that the contrast of the current image indicated the distribution of barrier heights. The histogram of current density calculated by taking into consideration a Gaussian distribution corresponded qualitatively to the experimental result.

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