TY - JOUR
T1 - Local transport property on ferromagnetic tunnel junction measured using conducting atomic force microscope
AU - Ando, Yasuo
AU - Kameda, Hiroshi
AU - Kubota, Hitoshi
AU - Miyazaki, Terunobu
PY - 1999
Y1 - 1999
N2 - The local topographical and electrical properties were measured simultaneously for a Ni80Fe20/Co/Al-oxide junction. Images with a lateral resolution of 1 nm and a current sensitivity of 3 pA were successfully obtained; no strong correlation between them was observed. From the results of local current-voltage characteristics also measured, it was clarified that the contrast of the current image indicated the distribution of barrier heights. The histogram of current density calculated by taking into consideration a Gaussian distribution corresponded qualitatively to the experimental result.
AB - The local topographical and electrical properties were measured simultaneously for a Ni80Fe20/Co/Al-oxide junction. Images with a lateral resolution of 1 nm and a current sensitivity of 3 pA were successfully obtained; no strong correlation between them was observed. From the results of local current-voltage characteristics also measured, it was clarified that the contrast of the current image indicated the distribution of barrier heights. The histogram of current density calculated by taking into consideration a Gaussian distribution corresponded qualitatively to the experimental result.
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U2 - 10.1143/jjap.38.l737
DO - 10.1143/jjap.38.l737
M3 - Article
AN - SCOPUS:0032594958
VL - 38
SP - L737-L739
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 7 A
ER -