Local transport property on ferromagnetic tunnel junction measured using conducting atomic force microscope

Yasuo Ando, Hiroshi Kameda, Hitoshi Kubota, Terunobu Miyazaki

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20 Citations (Scopus)

Abstract

The local topographical and electrical properties were measured simultaneously for a Ni80Fe20/Co/Al-oxide junction. Images with a lateral resolution of 1 nm and a current sensitivity of 3 pA were successfully obtained; no strong correlation between them was observed. From the results of local current-voltage characteristics also measured, it was clarified that the contrast of the current image indicated the distribution of barrier heights. The histogram of current density calculated by taking into consideration a Gaussian distribution corresponded qualitatively to the experimental result.

Original languageEnglish
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume38
Issue number7 A
Publication statusPublished - 1999 Jan 1

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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