The local topographical and electrical properties were measured simultaneously for a Ni80Fe20/Co/Al-oxide junction. Images with a lateral resolution of 1 nm and a current sensitivity of 3 pA were successfully obtained; no strong correlation between them was observed. From the results of local current-voltage characteristics also measured, it was clarified that the contrast of the current image indicated the distribution of barrier heights. The histogram of current density calculated by taking into consideration a Gaussian distribution corresponded qualitatively to the experimental result.
|Journal||Japanese Journal of Applied Physics, Part 2: Letters|
|Issue number||7 A|
|Publication status||Published - 1999 Jan 1|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)