Local structure around Ge atoms in IV-VI ferromagnetic semiconductor Ge0.6Mn0.4Te by x-ray fluorescence holography

Naohisa Happo; Yuki Takehara; Makoto Fujiwara; Koichi Tanaka; Shinya Senba; Shinya Hosokawa; Kouichi Hayashi; Wen Hu; Motohiro Suzuki; Hironori Asada

doi:10.1380/ejssnt.2011.247

Local structure around Ge atoms in IV-VI ferromagnetic semiconductor Ge_0.6Mn_0.4Te by x-ray fluorescence holography

Naohisa Happo, Yuki Takehara, Makoto Fujiwara, Koichi Tanaka, Shinya Senba, Shinya Hosokawa, Kouichi Hayashi, Wen Hu, Motohiro Suzuki, Hironori Asada

Materials Development Division

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

Local atomic structure around Ge atoms in Ge_1-xMn_xTe thin film single crystal has been investigated by X-ray fluorescence holography (XFH) at room temperature. Obtained atomic image suggests that the Ge position is not stable at the exact positions of fcc cation sublattice, and reveal the uctuations of Ge positions and/or the existence of cation vacancies.

Original language	English
Pages (from-to)	247-250
Number of pages	4
Journal	e-Journal of Surface Science and Nanotechnology
Volume	9
DOIs	https://doi.org/10.1380/ejssnt.2011.247
Publication status	Published - 2011 Jun 18

Keywords

And reflection
Diffraction
Fluctuation
Magnetic films
Molecular beam epitaxy
Semiconducting Films
X-ray scattering

ASJC Scopus subject areas

Biotechnology
Bioengineering
Condensed Matter Physics
Mechanics of Materials
Surfaces and Interfaces
Surfaces, Coatings and Films

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Local structure around Ge atoms in IV-VI ferromagnetic semiconductor Ge_0.6Mn_0.4Te by x-ray fluorescence holography. / Happo, Naohisa; Takehara, Yuki; Fujiwara, Makoto; Tanaka, Koichi; Senba, Shinya; Hosokawa, Shinya; Hayashi, Kouichi; Hu, Wen; Suzuki, Motohiro; Asada, Hironori.

In: e-Journal of Surface Science and Nanotechnology, Vol. 9, 18.06.2011, p. 247-250.

Research output: Contribution to journal › Article › peer-review

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abstract = "Local atomic structure around Ge atoms in Ge1-xMnxTe thin film single crystal has been investigated by X-ray fluorescence holography (XFH) at room temperature. Obtained atomic image suggests that the Ge position is not stable at the exact positions of fcc cation sublattice, and reveal the uctuations of Ge positions and/or the existence of cation vacancies.",

keywords = "And reflection, Diffraction, Fluctuation, Magnetic films, Molecular beam epitaxy, Semiconducting Films, X-ray scattering",

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AU - Tanaka, Koichi

AU - Senba, Shinya

AU - Hosokawa, Shinya

AU - Hayashi, Kouichi

AU - Hu, Wen

AU - Suzuki, Motohiro

AU - Asada, Hironori

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AB - Local atomic structure around Ge atoms in Ge1-xMnxTe thin film single crystal has been investigated by X-ray fluorescence holography (XFH) at room temperature. Obtained atomic image suggests that the Ge position is not stable at the exact positions of fcc cation sublattice, and reveal the uctuations of Ge positions and/or the existence of cation vacancies.

KW - And reflection

KW - Diffraction

KW - Fluctuation

KW - Magnetic films

KW - Molecular beam epitaxy

KW - Semiconducting Films

KW - X-ray scattering

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