Local-structure analysis around dopant atoms using multiple energy x-ray holography

Kouichi Hayashi; Masaki Matsui; Yasuhiro Awakura; Takahiro Kaneyoshi; Hajime Tanida; Masashi Ishii

doi:10.1103/physrevb.63.041201

Local-structure analysis around dopant atoms using multiple energy x-ray holography

Kouichi Hayashi, Masaki Matsui, Yasuhiro Awakura, Takahiro Kaneyoshi, Hajime Tanida, Masashi Ishii

Materials Development Division

Research output: Contribution to journal › Article › peer-review

57 Citations (Scopus)

Abstract

We used multiple energy x-ray holography (MEXH) to image the local atomic environment of Zn atoms doped in a GaAs wafer using synchrotron radiation and a multielement solid-state detector. The obtained atomic images revealed that the Zn atoms occupied substitutional site. By the comparison of the reconstructed images 1.41 Å above and below the emitter atom, the suppression of twin images due to MEXH was confirmed experimentally for certain atoms.

Original language	English
Article number	041201
Pages (from-to)	412011-412014
Number of pages	4
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	63
Issue number	4
DOIs	https://doi.org/10.1103/physrevb.63.041201
Publication status	Published - 2001

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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Local-structure analysis around dopant atoms using multiple energy x-ray holography. / Hayashi, Kouichi; Matsui, Masaki; Awakura, Yasuhiro; Kaneyoshi, Takahiro; Tanida, Hajime; Ishii, Masashi.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 63, No. 4, 041201, 2001, p. 412011-412014.

Research output: Contribution to journal › Article › peer-review

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