Local-structure analysis around dopant atoms using multiple energy x-ray holography

Kouichi Hayashi, Masaki Matsui, Yasuhiro Awakura, Takahiro Kaneyoshi, Hajime Tanida, Masashi Ishii

Research output: Contribution to journalArticlepeer-review

64 Citations (Scopus)


We used multiple energy x-ray holography (MEXH) to image the local atomic environment of Zn atoms doped in a GaAs wafer using synchrotron radiation and a multielement solid-state detector. The obtained atomic images revealed that the Zn atoms occupied substitutional site. By the comparison of the reconstructed images 1.41 Å above and below the emitter atom, the suppression of twin images due to MEXH was confirmed experimentally for certain atoms.

Original languageEnglish
Article number041201
Pages (from-to)412011-412014
Number of pages4
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number4
Publication statusPublished - 2001

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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