Local probing of magnetization reversal in Ni-Fe elliptical dots with variable geometry

Y. Endo, H. Fujimoto, R. Nakatani, M. Yamamoto

Research output: Contribution to journalArticle

Abstract

We have investigated the detailed magnetization reversal in 10-nm-thick Ni-Fe elliptical dots with several dot sizes using magnetic field sweeping (MFS)-magnetic force microscopy (MFM). At the dot edges, the shape of the phase (the stray field) curve versus magnetic field changes from a stepped hysteresis loop to a almost nonstepped hysteresis loop with increasing dot size. On the other hand, at the center within the dot, sharp or weak decreases in phase are observed as the magnetic field is varied. From these results, it is found that, in the magnetization reversal of a 10-nm-thick Ni-Fe elliptical dot with several dot sizes, the dominant factor changes from the change in the magnetic domain configuration to the domain wall motion as the length of major axis increases.

Original languageEnglish
Pages (from-to)3244-3247
Number of pages4
JournalIEEE Transactions on Magnetics
Volume44
Issue number11 PART 2
DOIs
Publication statusPublished - 2008 Nov

Keywords

  • Magnetic elliptical dot
  • Magnetic force microscopy (MFM)
  • Magnetization reversal

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Local probing of magnetization reversal in Ni-Fe elliptical dots with variable geometry'. Together they form a unique fingerprint.

  • Cite this