TY - JOUR
T1 - Local magnetic measurements of composition-spread manganese oxide thin films with a scanning SQUID microscope
AU - Kageyama, T.
AU - Hasegawa, T.
AU - Koida, T.
AU - Ohtani, M.
AU - Fukumura, Tomoteru
AU - Kawasaki, M.
AU - Koinuma, H.
PY - 2001/12/1
Y1 - 2001/12/1
N2 - We performed scanning SQUID microscopic measurements on composition-spread La1-xSrxMnO3 films deposited on various substrates. In thick films, the obtained local magnetic property as a function of x reproduces the bulk phase diagram well. In thin films (40 nm), we found that the phase boundaries significantly shifted depending on substrate materials. The stability of magnetic phases is discussed in term of the local strain associated with the lattice mismatch between film and substrate.
AB - We performed scanning SQUID microscopic measurements on composition-spread La1-xSrxMnO3 films deposited on various substrates. In thick films, the obtained local magnetic property as a function of x reproduces the bulk phase diagram well. In thin films (40 nm), we found that the phase boundaries significantly shifted depending on substrate materials. The stability of magnetic phases is discussed in term of the local strain associated with the lattice mismatch between film and substrate.
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U2 - 10.1007/s003390100666
DO - 10.1007/s003390100666
M3 - Article
AN - SCOPUS:0034849114
VL - 72
JO - Applied Physics A: Materials Science and Processing
JF - Applied Physics A: Materials Science and Processing
SN - 0947-8396
IS - 8
ER -