Local magnetic measurements of composition-spread manganese oxide thin films with a scanning SQUID microscope

T. Kageyama; T. Hasegawa; T. Koida; M. Ohtani; Tomoteru Fukumura; M. Kawasaki; H. Koinuma

doi:10.1007/s003390100666

Local magnetic measurements of composition-spread manganese oxide thin films with a scanning SQUID microscope

T. Kageyama, T. Hasegawa, T. Koida, M. Ohtani, Tomoteru Fukumura, M. Kawasaki, H. Koinuma

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

We performed scanning SQUID microscopic measurements on composition-spread La_1-xSr_xMnO₃ films deposited on various substrates. In thick films, the obtained local magnetic property as a function of x reproduces the bulk phase diagram well. In thin films (40 nm), we found that the phase boundaries significantly shifted depending on substrate materials. The stability of magnetic phases is discussed in term of the local strain associated with the lattice mismatch between film and substrate.

Original language	English
Journal	Applied Physics A: Materials Science and Processing
Volume	72
Issue number	8
DOIs	https://doi.org/10.1007/s003390100666
Publication status	Published - 2001 Dec 1
Externally published	Yes

ASJC Scopus subject areas

Materials Science(all)
Physics and Astronomy (miscellaneous)
Chemistry(all)

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T1 - Local magnetic measurements of composition-spread manganese oxide thin films with a scanning SQUID microscope

AU - Kageyama, T.

AU - Hasegawa, T.

AU - Koida, T.

AU - Ohtani, M.

AU - Fukumura, Tomoteru

AU - Kawasaki, M.

AU - Koinuma, H.

PY - 2001/12/1

Y1 - 2001/12/1

N2 - We performed scanning SQUID microscopic measurements on composition-spread La1-xSrxMnO3 films deposited on various substrates. In thick films, the obtained local magnetic property as a function of x reproduces the bulk phase diagram well. In thin films (40 nm), we found that the phase boundaries significantly shifted depending on substrate materials. The stability of magnetic phases is discussed in term of the local strain associated with the lattice mismatch between film and substrate.

AB - We performed scanning SQUID microscopic measurements on composition-spread La1-xSrxMnO3 films deposited on various substrates. In thick films, the obtained local magnetic property as a function of x reproduces the bulk phase diagram well. In thin films (40 nm), we found that the phase boundaries significantly shifted depending on substrate materials. The stability of magnetic phases is discussed in term of the local strain associated with the lattice mismatch between film and substrate.

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