Local magnetic measurements of composition-spread manganese oxide thin films with a scanning SQUID microscope

T. Kageyama, T. Hasegawa, T. Koida, M. Ohtani, Tomoteru Fukumura, M. Kawasaki, H. Koinuma

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

We performed scanning SQUID microscopic measurements on composition-spread La1-xSrxMnO3 films deposited on various substrates. In thick films, the obtained local magnetic property as a function of x reproduces the bulk phase diagram well. In thin films (40 nm), we found that the phase boundaries significantly shifted depending on substrate materials. The stability of magnetic phases is discussed in term of the local strain associated with the lattice mismatch between film and substrate.

Original languageEnglish
JournalApplied Physics A: Materials Science and Processing
Volume72
Issue number8
DOIs
Publication statusPublished - 2001 Dec 1
Externally publishedYes

ASJC Scopus subject areas

  • Materials Science(all)
  • Physics and Astronomy (miscellaneous)
  • Chemistry(all)

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