Local excitation and emission dynamics of an isolated single basal-plane stacking-fault in GaN studied by spatio-time-resolved cathodoluminescence

Kentaro Furusawa, Yoichi Ishikawa, Hirotaka Ikeda, Kenji Fujito, Shigefusa F. Chichibu

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

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Engineering & Materials Science

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