Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy

Mitsuhiro Saito, Koji Kimoto, Takuro Nagai, Shun Fukushima, Daisuke Akahoshi, Hideki Kuwahara, Yoshio Matsui, Kazuo Ishizuka

Research output: Contribution to journalArticlepeer-review

42 Citations (Scopus)

Abstract

We demonstrate local crystal structure analysis based on annular dark-field (ADF) imaging in scanning transmission electron microscopy (STEM). Using a stabilized STEM instrument and customized software, we first realize high accuracy of elemental discrimination and atom-position determination with a 10-pm-order accuracy, which can reveal major cation displacements associated with a variety of material properties, e.g. ferroelectricity and colossal magnetoresistivity. A-site ordereddisordered perovskite manganites Tb0.5Ba0.5MnO3 are analysed; A-site ordering and a Mn-site displacement of 12 pm are detected in each specific atomic column. This method can be applied to practical and advanced materials, e.g. strongly correlated electron materials.

Original languageEnglish
Pages (from-to)131-136
Number of pages6
JournalJournal of Electron Microscopy
Volume58
Issue number3
DOIs
Publication statusPublished - 2009 Jun
Externally publishedYes

Keywords

  • Annular dark-field imaging
  • Channelling
  • Crystal structure analysis
  • Perovskite oxide
  • Scanning transmission electron microscopy
  • Software

ASJC Scopus subject areas

  • Instrumentation

Fingerprint

Dive into the research topics of 'Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy'. Together they form a unique fingerprint.

Cite this