Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy

Mitsuhiro Saito, Koji Kimoto, Takuro Nagai, Shun Fukushima, Daisuke Akahoshi, Hideki Kuwahara, Yoshio Matsui, Kazuo Ishizuka

    Research output: Contribution to journalArticlepeer-review

    39 Citations (Scopus)

    Abstract

    We demonstrate local crystal structure analysis based on annular dark-field (ADF) imaging in scanning transmission electron microscopy (STEM). Using a stabilized STEM instrument and customized software, we first realize high accuracy of elemental discrimination and atom-position determination with a 10-pm-order accuracy, which can reveal major cation displacements associated with a variety of material properties, e.g. ferroelectricity and colossal magnetoresistivity. A-site ordereddisordered perovskite manganites Tb0.5Ba0.5MnO3 are analysed; A-site ordering and a Mn-site displacement of 12 pm are detected in each specific atomic column. This method can be applied to practical and advanced materials, e.g. strongly correlated electron materials.

    Original languageEnglish
    Pages (from-to)131-136
    Number of pages6
    JournalJournal of Electron Microscopy
    Volume58
    Issue number3
    DOIs
    Publication statusPublished - 2009 Jun

    Keywords

    • Annular dark-field imaging
    • Channelling
    • Crystal structure analysis
    • Perovskite oxide
    • Scanning transmission electron microscopy
    • Software

    ASJC Scopus subject areas

    • Instrumentation

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