Liquid phase epitaxial growth and characterization of LiNbO3 single crystal films

Taketoshi Hibiya, Hiroe Suzuki, Ichiro Yonenaga, Shigeru Kimura, Tatsuo Kawaguchi, Toetsu Shishido, Tsuguo Fukuda

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)


LiNbO3 (LN) thin film crystals are prepared on LN substrates by a liquid phase epitaxial method. An X-ray double crystal diffraction technique is used to characterize misfit strain in LN films. Analysis of lattice parameter differences along the c-axis shows that LN films of almost stoichiometric composition can be grown on an LN substrate prepared by the Czochralski method. X-ray topography reveals that the LN films have a lower dislocation density than the substrate crystals. Surface morphology is changed with increasing film thickness; thicker films do not show a mirror surface, rather hillocks with a three-fold symmetry appear.

Original languageEnglish
Pages (from-to)213-217
Number of pages5
JournalJournal of Crystal Growth
Issue number3-4
Publication statusPublished - 1994 Dec 2

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry


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