The layer-by-layer growth of high-optical-quality ZnO thin films on atomically smooth and lattice relaxed ZnO buffer layer was discussed. The intensity oscillation of reflection high-energy electron diffraction persisted for more than a 100-nm film deposition under optimized conditions on buffer layer. It was found that the thin films showed free exciton emissions in a 5 K photoluminescence.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)