Layer-by-layer crystallization of Co 2FeSi Heusler alloy thin films

L. R. Fleet, G. Cheglakov, K. Yoshida, V. K. Lazarov, T. Nakayama, A. Hirohata

Research output: Contribution to journalReview articlepeer-review

10 Citations (Scopus)

Abstract

Grain-size evolution with increasing annealing time has been investigated in polycrystalline Co 2FeSi films. The samples were prepared by sputtering giving differing grain sizes. Large grains were formed after annealing at 500°C, with grains over 200nm forming in the L2 1 phase in a layer-by-layer mode. Further annealing causes a decrease in the average grain size, agreeing well with previously reported results for Co 2MnSi. Magnetic measurements showed moments with values of up to 75% of those predicted from the SlaterPauling curve providing further evidence for the formation of the L2 1 phase.

Original languageEnglish
Article number032001
JournalJournal of Physics D: Applied Physics
Volume45
Issue number3
DOIs
Publication statusPublished - 2012 Jan 25
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

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