Late-news poster: Precise measurement of LC material parameters for ultra-high resolution full-HD OCB-mode FSC-LCD

Tadashi Kishimoto, Kazuhiro Wako, Takahiro Ishinabe, Tetsuya Miyashita, Yoshito Suzuki, Tatsuo Uchida

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)

Abstract

A highly precise measurement method of LC material parameters was proposed by application of the new driving scheme of LC and the compensation for the capacitance of alignment layer and the anchoring strength of LC cell. This new measurement method results in the development of high-speed 6.5inch Full-HD OCB-mode FSC-LCD with an ultra-high resolution, high brightness and low power consumption.

Original languageEnglish
Pages (from-to)1857-1860
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume39
Issue number3
DOIs
Publication statusPublished - 2008 Jan 1
Event2008 SID International Symposium - Los Angeles, CA, United States
Duration: 2008 May 202008 May 21

ASJC Scopus subject areas

  • Engineering(all)

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