Laser interferometer using thin film photodetector

Minoru Sasaki, Xiaoyu Mi, Kazuhiro Hane

Research output: Contribution to journalConference articlepeer-review

Abstract

Novel thin film photodiode is proposed. The active layer is thinner than the wavelength of the incident light. A part of the incident light beam is detected and the rest passes through the thin film photodiode without the absorption. Being inserted in the optical field, this sensor can detect the intensity profile formed along the propagating direction of the laser beam. This function is applied to construct the new interferometer detecting the intensity profile of the standing wave produced by the incoming and the reflected laser beams.

Original languageEnglish
Pages (from-to)173-180
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3631
Publication statusPublished - 1999
EventProceedings of the 1999 Optoelectornic Integrated Circuits and Packaging III - San Jose, CA, USA
Duration: 1999 Jan 281999 Jan 29

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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