Abstract
An electrostatically driven micromirror device using a thin-film torsion bar is proposed. The mirror rotation angle of 7.3° at 5 V is demonstrated at the nonresonant condition. A bulk Si micromirror is suspended by SiN thin-film torsion bars. Inside the torsion bar, the tension having the magnitude larger than that of the driving force is included. The torsion bar can have a compliance with the mirror rotation and the rigidity against the unwanted motions (e.g., vertical displacement or in-plane rotation).
Original language | English |
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Pages (from-to) | 1573-1575 |
Number of pages | 3 |
Journal | IEEE Photonics Technology Letters |
Volume | 18 |
Issue number | 15 |
DOIs | |
Publication status | Published - 2006 Aug 1 |
Keywords
- Electrostatic driving
- Low-voltage driving
- Micromirror
- Tension
- Thin-film torsion bar
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering