Lanthanum oxide for gate dielectric insulator

K. Kakushima, K. Tsutsui, T. Hattori, H. Iwai

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    A feasibility study of La2O3, one of the rare earth oxides, for replacing SiO2 gate oxide for CMOS integrated circuits has been reported. It is found that La2O3 after a proper heat treatment has fairly good electrical properties for gate insulator applications in MOSFETs, namely high barrier height for the conduction band electrons and valence band holes as well as its high dielectric constant The conduction mechanism of La2O3 gate insulator has been modeled, and has been shown to be mainly by space charge limited current (SCLC). Long channel MOSFETs with La2O3 gate insulator has been fabricated, where the best effective mobility is 319 cm2/Vs with 2.3 nm of EOT. Interfacial layer (IL) growth suppression due to heat treatment is also reported.

    Original languageEnglish
    Title of host publication2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages161-166
    Number of pages6
    ISBN (Print)0780393392, 9780780393394
    DOIs
    Publication statusPublished - 2005 Jan 1
    Event2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC - Howloon, Hong Kong
    Duration: 2005 Dec 192005 Dec 21

    Publication series

    Name2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC

    Other

    Other2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
    CountryHong Kong
    CityHowloon
    Period05/12/1905/12/21

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Electronic, Optical and Magnetic Materials

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  • Cite this

    Kakushima, K., Tsutsui, K., Hattori, T., & Iwai, H. (2005). Lanthanum oxide for gate dielectric insulator. In 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC (pp. 161-166). [1635231] (2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDSSC.2005.1635231