Landscape of combinatorial materials exploration and high throughput characterizations for the post-cmos devices

Toyohiro Chikyo, K. Ohmori, T. Nagata, N. Umezawa, M. Haemori, M. Yoshitake, T. Hasegawa, H. Koinuma, K. Yamada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
Original languageEnglish
Title of host publication2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA
Pages66-67
Number of pages2
DOIs
Publication statusPublished - 2008 Aug 14
Externally publishedYes
Event2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA - Hsinchu, Taiwan, Province of China
Duration: 2008 Apr 212008 Apr 23

Publication series

NameInternational Symposium on VLSI Technology, Systems, and Applications, Proceedings

Other

Other2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA
CountryTaiwan, Province of China
CityHsinchu
Period08/4/2108/4/23

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Chikyo, T., Ohmori, K., Nagata, T., Umezawa, N., Haemori, M., Yoshitake, M., Hasegawa, T., Koinuma, H., & Yamada, K. (2008). Landscape of combinatorial materials exploration and high throughput characterizations for the post-cmos devices. In 2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA (pp. 66-67). [4530801] (International Symposium on VLSI Technology, Systems, and Applications, Proceedings). https://doi.org/10.1109/VTSA.2008.4530801