Abstract
The influence of eg electrons on resonant x-ray scattering was studied using RE1-xSrxMnO3 (RE: rare earth) thin films having an electron configuration of (t2g) 3(eg)1-x. Based on the rigorous measurements of the Jahn-Teller (JT) distortion incorporating the buckling of the MnO 6 octahedra, we found that the JT distortion has the dominant effect in accordance with the previous reports. The data regarding the x = 1 sample, in which eg electrons are absent, scales perfectly well with those regarding x = 0.4 samples, confirming that the role played by eg electrons is negligible.
Original language | English |
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Article number | 144414 |
Pages (from-to) | 144414-1-144414-7 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 69 |
Issue number | 14 |
DOIs | |
Publication status | Published - 2004 Apr |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics