Laboratory EXAFS spectrometer with a bent crystal, a solid-state detector, and a fast detection system

Kazuyuki Tohji, Yasuo Udagawa, Tsutomu Kawasaki, Kenji Masuda

Research output: Contribution to journalArticle

47 Citations (Scopus)

Abstract

A laboratory x-ray absorption spectrometer is described which consists of a Johansson-cut bent crystal, a rotating anode x-ray generator, and a fast SSD (solid-state detector). Because the SSD can completely discriminate the undesired reflections, contamination of the harmonics is avoided while maintaining a high-source voltage necessary for strong x-ray flux. Fast electronics equipment is employed to keep up with high-x-ray intensity. It is also possible to utilize higher-order reflections for high resolving power. The data of quality comparable to those obtained at synchrotron radiation facilities can be obtained in a comparable period of time. In addition, the determination of the absolute absorbance as defined is possible, which makes the problem of the background subtraction in EXAFS analysis easy.

Original languageEnglish
Pages (from-to)1482-1487
Number of pages6
JournalReview of Scientific Instruments
Volume54
Issue number11
DOIs
Publication statusPublished - 1983 Dec 1
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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