Ionic fragmentation of SiH4 following the L-shell excitation

Yukinori Sato; Kiyoshi Ueda; Akira Yagishita; Taizo Sasaki; Tetsuo Nagata; Tatsuji Hayaishi; Masuhiro Yoshino; Tetsuo Koizumi; A. A. MacDowell

doi:10.1088/0031-8949/41/1/014

Ionic fragmentation of SiH₄ following the L-shell excitation

Yukinori Sato, Kiyoshi Ueda, Akira Yagishita, Taizo Sasaki, Tetsuo Nagata, Tatsuji Hayaishi, Masuhiro Yoshino, Tetsuo Koizumi, A. A. MacDowell

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Abstract

Ionic photofragmentation of SiH₄ has been studied in the vicinity of the Si: L-edge using synchrotron radiation and time-of-flight mass spectrometry. Relative ionization efficiencies for more then 10 ionic fragment species and pair-ionization efficiencies for the pairs H⁺ + SiH_n⁺ (n=0, 1 and 2) have been obtained as a function of the photon energy from 100 to 200 eV from the photoelectron-photion and the photoion-photoion coincidence measurements. Ionic dissociation of the continuum Si: 2p hole states may occur mostly via double ionization of the parent molecule giving rise to two types of dissociation channels; (type A) SiH₄⁺⁺ → H⁺ + H⁺ + neutrals and (type B) SiH₄⁺⁺ → H⁺ + Si⁺ (or SiH⁺) + neutrals. The average kinetic-energy release given to H⁺ is much higher in the dissociation channel B than in the dissociation channel A suggesting temporal existence of localized and delocalized valence-two-hole states.

Original language	English
Pages (from-to)	55-58
Number of pages	4
Journal	Physica Scripta
Volume	41
Issue number	1
DOIs	https://doi.org/10.1088/0031-8949/41/1/014
Publication status	Published - 1990 Jan 1

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Mathematical Physics
Condensed Matter Physics
Physics and Astronomy(all)

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10.1088/0031-8949/41/1/014

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title = "Ionic fragmentation of SiH4 following the L-shell excitation",

abstract = "Ionic photofragmentation of SiH4 has been studied in the vicinity of the Si: L-edge using synchrotron radiation and time-of-flight mass spectrometry. Relative ionization efficiencies for more then 10 ionic fragment species and pair-ionization efficiencies for the pairs H+ + SiHn+ (n=0, 1 and 2) have been obtained as a function of the photon energy from 100 to 200 eV from the photoelectron-photion and the photoion-photoion coincidence measurements. Ionic dissociation of the continuum Si: 2p hole states may occur mostly via double ionization of the parent molecule giving rise to two types of dissociation channels; (type A) SiH4++ → H+ + H+ + neutrals and (type B) SiH4++ → H+ + Si+ (or SiH+) + neutrals. The average kinetic-energy release given to H+ is much higher in the dissociation channel B than in the dissociation channel A suggesting temporal existence of localized and delocalized valence-two-hole states.",

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doi = "10.1088/0031-8949/41/1/014",

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T1 - Ionic fragmentation of SiH4 following the L-shell excitation

AU - Sato, Yukinori

AU - Ueda, Kiyoshi

AU - Yagishita, Akira

AU - Sasaki, Taizo

AU - Nagata, Tetsuo

AU - Hayaishi, Tatsuji

AU - Yoshino, Masuhiro

AU - Koizumi, Tetsuo

AU - MacDowell, A. A.

PY - 1990/1/1

Y1 - 1990/1/1

N2 - Ionic photofragmentation of SiH4 has been studied in the vicinity of the Si: L-edge using synchrotron radiation and time-of-flight mass spectrometry. Relative ionization efficiencies for more then 10 ionic fragment species and pair-ionization efficiencies for the pairs H+ + SiHn+ (n=0, 1 and 2) have been obtained as a function of the photon energy from 100 to 200 eV from the photoelectron-photion and the photoion-photoion coincidence measurements. Ionic dissociation of the continuum Si: 2p hole states may occur mostly via double ionization of the parent molecule giving rise to two types of dissociation channels; (type A) SiH4++ → H+ + H+ + neutrals and (type B) SiH4++ → H+ + Si+ (or SiH+) + neutrals. The average kinetic-energy release given to H+ is much higher in the dissociation channel B than in the dissociation channel A suggesting temporal existence of localized and delocalized valence-two-hole states.

AB - Ionic photofragmentation of SiH4 has been studied in the vicinity of the Si: L-edge using synchrotron radiation and time-of-flight mass spectrometry. Relative ionization efficiencies for more then 10 ionic fragment species and pair-ionization efficiencies for the pairs H+ + SiHn+ (n=0, 1 and 2) have been obtained as a function of the photon energy from 100 to 200 eV from the photoelectron-photion and the photoion-photoion coincidence measurements. Ionic dissociation of the continuum Si: 2p hole states may occur mostly via double ionization of the parent molecule giving rise to two types of dissociation channels; (type A) SiH4++ → H+ + H+ + neutrals and (type B) SiH4++ → H+ + Si+ (or SiH+) + neutrals. The average kinetic-energy release given to H+ is much higher in the dissociation channel B than in the dissociation channel A suggesting temporal existence of localized and delocalized valence-two-hole states.

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Ionic fragmentation of SiH₄ following the L-shell excitation

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