Rutherford backscattering and channeling measurements have been applied to study deep radiation damage and depth profile of implanted Au atoms in pure Cu and Cu-1 at. % Ni alloy single-crystal specimens, which were irradiated off axis at room temperature by 300 keV Au+ ions to a dose of 2 × 1016 ions/cm2. The damage range and depth range of the implanted Au atoms in the specimens of pure Cu were strikingly deeper than those in the specimens of Cu-1 at. % Ni alloys, respectively. An atom movement mechanism in solids under ion beam irradiation is proposed as the origin of the observed result.
|Number of pages||4|
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|Publication status||Published - 2001 Aug 20|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics