TY - GEN
T1 - Investigation on the effect of parasitic inductance at connector contact boundary on electromagnetic radiation
AU - Hayashi, Yu-Ichi
AU - Matsuda, Kazuki
AU - Mizuki, Takaaki
AU - Sone, Hideaki
PY - 2012/8/15
Y1 - 2012/8/15
N2 - A loosened connector causes an increase in electromagnetic radiation when electric devices operate in high-frequency bands. To investigate the mechanisms generating electromagnetic radiation due to a loose contact in a connector, we estimate high-frequency circuit elements at the contact boundary of a loosened connector. On the basis of this estimation, we show the relationship between high-frequency circuit elements and the electromagnetic radiation from electric devices through experiments.
AB - A loosened connector causes an increase in electromagnetic radiation when electric devices operate in high-frequency bands. To investigate the mechanisms generating electromagnetic radiation due to a loose contact in a connector, we estimate high-frequency circuit elements at the contact boundary of a loosened connector. On the basis of this estimation, we show the relationship between high-frequency circuit elements and the electromagnetic radiation from electric devices through experiments.
UR - http://www.scopus.com/inward/record.url?scp=84864842494&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84864842494&partnerID=8YFLogxK
U2 - 10.1109/APEMC.2012.6237952
DO - 10.1109/APEMC.2012.6237952
M3 - Conference contribution
AN - SCOPUS:84864842494
SN - 9781457715587
T3 - cccc2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings
SP - 65
EP - 68
BT - 2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings
T2 - 2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012
Y2 - 21 May 2012 through 24 May 2012
ER -