Investigation on the effect of parasitic inductance at connector contact boundary on electromagnetic radiation

Yu-Ichi Hayashi, Kazuki Matsuda, Takaaki Mizuki, Hideaki Sone

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A loosened connector causes an increase in electromagnetic radiation when electric devices operate in high-frequency bands. To investigate the mechanisms generating electromagnetic radiation due to a loose contact in a connector, we estimate high-frequency circuit elements at the contact boundary of a loosened connector. On the basis of this estimation, we show the relationship between high-frequency circuit elements and the electromagnetic radiation from electric devices through experiments.

Original languageEnglish
Title of host publication2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings
Pages65-68
Number of pages4
DOIs
Publication statusPublished - 2012 Aug 15
Event2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Singapore, Singapore
Duration: 2012 May 212012 May 24

Publication series

Namecccc2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings

Other

Other2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012
CountrySingapore
CitySingapore
Period12/5/2112/5/24

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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