Investigation of pixelated TlBr gamma-ray spectrometers with the depth-sensing technique

Keitaro Hitomi, Toshiyuki Onodera, Tadayoshi Shoji, Zhong He

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

Pixelated thallium bromide (TlBr) detectors with a thickness of 4.2 mm have been fabricated and investigated with the depth-sensing technique. The energy resolution of the device was improved from 1.95% FWHM to 1.25% FWHM at 662 keV by implementation of the depth correction. The device exhibited an energy resolution of 1.03% FWHM at 662 keV by selecting gamma-ray interaction events occurring underneath the cathode.

Original languageEnglish
Pages (from-to)276-278
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume591
Issue number1
DOIs
Publication statusPublished - 2008 Jun 11

Keywords

  • Position-sensitive detectors
  • Semiconductor detectors
  • Thallium bromide

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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