Investigation of noise interference due to connector contact failure in a coaxial cable

Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Increased inductance values and contact resistance in connector contact surfaces due to degradation of connector contact performance have been reported. In particular, inductance increases while degradation remains minimal. We focus on slight loosening in which increased inductance values are observed without increased resistance values, and investigate the effect of loose connectors on transmission line coupling noise under such circumstances. We find a proportional relation between coupled noise current and frequency. Moreover, we find a proportional relation between the increased inductance value, which depends on the change in connector contact distribution, and the coupled noise current in the transmission line. Copyright

Original languageEnglish
Pages (from-to)900-903
Number of pages4
JournalIEICE Transactions on Electronics
VolumeE97-C
Issue number9
DOIs
Publication statusPublished - 2014 Sep 1

Keywords

  • Contact failure
  • Electromagnetic interference
  • Loose contact

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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