Investigation of interface between fullerene molecule and Si (111)-7×7 surface by noncontact scanning nonlinear dielectric microscopy

Shin Ichiro Kobayashi, Yasuo Cho

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

Fullerene (C60) molecules deposited on Si (111)-7×7 reconstructed (7×7) surface were investigated by noncontact scanning nonlinear dielectric microscopy (NC-SNDM) under ultrahigh vacuum conditions. Both topography and induced electric dipole moment of individual C60 molecules were successfully resolved with molecular-scale resolution. Charge transfer from the Si dangling bonds to the C60 molecule occurs and induces an electric dipole moment at almost all C60 sites. On the application of an alternating voltage, the downward electric dipole moment is nonlinearly modulated due to the electric property at the interface. The NC-SNDM technique can thus detect the electric dipole moment induced at interface between the C60 molecule and the Si adatom in 7×7 surface by the charge transfer from the Si adatom to C60 molecule.

Original languageEnglish
Pages (from-to)C4D18-C4D23
JournalJournal of Vacuum Science and Technology B:Nanotechnology and Microelectronics
Volume28
Issue number3
DOIs
Publication statusPublished - 2010 May

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Process Chemistry and Technology
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering
  • Materials Chemistry

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