Inverse Fourier analysis in x-ray fluorescence holography

Koichi Hayashi

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

X-ray fluorescence holography (XFH) is a promising tool for determing the local structures around specified elements. To obtain accurate interatomic distances, we applied inverse Fourier analysis, which has often been used to investigate extended x-ray absorption fine structures, to multiple energy x-ray holograms. The interatomic distances of neighboring atoms around a fluorescing atom were estimated from the 16 experimental holograms of a Au single crystal and most of them were in good agreement with the actual values within an error of 0.3%. The use of inverse Fourier analysis improves the XFH for the evaluation of quantitative local lattice distortion around impurities in single crystals.

Original languageEnglish
Article number224104
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume71
Issue number22
DOIs
Publication statusPublished - 2005 Jun 1

ASJC Scopus subject areas

  • Condensed Matter Physics

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