Introduction to the special issue: High-k reliability - Status 2009

Luigi Pantisano, Byoung Hun Lee, Masaaki Niwa

Research output: Contribution to journalEditorialpeer-review

Original languageEnglish
Article number5062540
Pages (from-to)145-146
Number of pages2
JournalIEEE Transactions on Device and Materials Reliability
Volume9
Issue number2
DOIs
Publication statusPublished - 2009 Jun 1
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

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