Intrinsic Josephson junctions in c-axis-oriented La1.85Sr 0.15CuO4 thin films

Y. Mizugaki, Y. Uematsu, S. J. Kim, J. Chen, K. Nakajima, T. Yamashita, H. Sato, M. Naito

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)


The current-voltage characteristics (IVC) of intrinsic Josephson junctions (IJJ) in c-axis-oriented La2-xSrxCuO4 (LSCO) thin films were demonstrated. The large intrinsic junctions (LIJ) with a mesa structure exhibited resistively shunted junction (RSJ)-like IVCs. The results indicated that the IJJs in the LSCO thin films are characterized as stacked SIS Josephson junctions and that the grain boundaries act as shunting resistance.

Original languageEnglish
Pages (from-to)2534-2537
Number of pages4
JournalJournal of Applied Physics
Issue number4
Publication statusPublished - 2003 Aug 15
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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