Abstract
The current-voltage characteristics (IVC) of intrinsic Josephson junctions (IJJ) in c-axis-oriented La2-xSrxCuO4 (LSCO) thin films were demonstrated. The large intrinsic junctions (LIJ) with a mesa structure exhibited resistively shunted junction (RSJ)-like IVCs. The results indicated that the IJJs in the LSCO thin films are characterized as stacked SIS Josephson junctions and that the grain boundaries act as shunting resistance.
Original language | English |
---|---|
Pages (from-to) | 2534-2537 |
Number of pages | 4 |
Journal | Journal of Applied Physics |
Volume | 94 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2003 Aug 15 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy(all)