The (001)-oriented and (110)-oriented epitaxial grown Co2Fe0.4Mn0.6Si films were fabricated by magnetron sputtering technique in order to investigate the annealing temperature dependence of the intrinsic Gilbert damping constant (α). The stuck films, deposited on MgO and Al2O3 a-plane substrates, respectively, were annealed at various temperatures ranging from 400-°C to 550-°C. The X-ray diffraction analysis was conducted to confirm that all the films were epitaxially grown. In addition, the ferromagnetic resonance measurements as well as the vibrating sample magnetometer were carried out to determine their magnetic properties. A small α of 0.004 was recorded for the sample with 001-oriented Co2Fe0.4Mn0.6Si (CFMS (001)) and 110-oriented CFMS (CFMS (110)) annealed at 450-°C.
ASJC Scopus subject areas
- Physics and Astronomy(all)