Interlayer thickness dependence of 90° exchange coupling in Co2 MnAl/Cr/ Co2 MnAl epitaxial trilayer structures

S. Bosu, Y. Sakuraba, K. Saito, H. Wang, S. Mitani, K. Takanashi, C. Y. You, K. Hono

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

The spacer layer thickness dependence of interlayer exchange coupling has been investigated in the fully epitaxial trilayers of the Co2 MnAl (CMA)/Cr/CMA structure. A series of high-quality samples of CMA (20 nm)/Cr (tCr =0.3-8.1 nm) /CMA (10 nm) trilayers was prepared on a MgO substrate by ultrahigh vacuum compatible dc sputtering. Comparison of the results of the experiments and the simulations of magnetization curves revealed novel behavior, dominating the 90° coupling and the absence of 180° coupling. No clear oscillation, only a peak of the 90° coupling strength (J2 ∼-0.68 erg/ cm2), was observed at tCr =1.2 nm.

Original languageEnglish
Article number07C710
JournalJournal of Applied Physics
Volume105
Issue number7
DOIs
Publication statusPublished - 2009

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Interlayer thickness dependence of 90° exchange coupling in Co2 MnAl/Cr/ Co2 MnAl epitaxial trilayer structures'. Together they form a unique fingerprint.

Cite this