Interlayer exchange coupling was investigated in Co2FeSi(20nm)/ Cr(tCr=0.6 to 3 nm)/Co2FeSi(7 nm) epitaxial trilayer structures by M-H loop measurement and using a numerical simulation method. The epitaxial growth and the presence of partial B2 ordering in Co2FeSi films were confirmed from the XRD patterns. The bilinear coupling parameter J1 and 90° coupling parameter J2 were determined from the numerical simulation of M-H loops for trilayers. The absence of 180° coupling and the presence of dominating 90° coupling were observed from the comparison between the numerical simulations and measured M-H loops within a wide range of spacer thickness. The strength of the 90° coupling was found to vary with the spacer thickness and only a peak of J2 was observed at tCr=1.2 nm.
- 90° coupling
- B2 ordering
- Full-Heusler alloy
- Interlayer exchange coupling
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering