Interlayer exchange coupling dependence of thermal stability parameters in synthetic antiferromagnetic free layers

Yoshiaki Saito, H. Sugiyama, T. Inokuchi, K. Inomata

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

We conducted a detailed comparative study of thermal stability properties over a thermal excitation of switching of the free layer in a magnetic tunnel junction (MTJ) with Ni 81Fe 19, Co 90Fe 10, and synthetic antiferromagnetic (Syn-AF) free layers with several strengths of interlayer exchange coupling (J EX). The thermal stability properties were investigated using the junction magnetoresistance of current-perpendicular MTJ devices with a word line as probes. The observed sweep-rate-dependent coercivities were analyzed using the Sharrock formula. The results confirmed strong J EX dependence on thermal stability parameters ( K u V / kT ) in Syn-AF free layers. The values of K u V / k B T for MTJs with Syn-AF free layers decreased with a decrease in the strength of J EX, and the increase in the effective volume of the Syn-AF free layer disappeared at J EX {less-than or slanted equal to} 0.52 erg / cm 2. The Syn-AF free layer with J EX>0.52 erg/cm 2 is relevant for high-density spin electronic nanodevices with a low aspect ratio.

Original languageEnglish
Pages (from-to)34-38
Number of pages5
JournalJournal of Magnetism and Magnetic Materials
Volume303
Issue number1
DOIs
Publication statusPublished - 2006 Aug 1
Externally publishedYes

Keywords

  • Interlayer exchange coupling
  • Magnetic tunnel junctions
  • Synthetic antiferromagnetic free layers
  • Thermal stability parameters

ASJC Scopus subject areas

  • Condensed Matter Physics

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